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WHITE PAPER

Critical SASE and SD-WAN Test Patterns and Measurements


sc-sd-wan-critical-test-patterns-and-measurements

The accelerating adoption of Secure Access Service Edge (SASE) and Software-Defined Wide Area Network (SD-WAN) environments has great potential for enhancing security and performance while cutting costs compared to traditional Multi-Protocol Label Switching (MPLS) or dedicated point-to-point lines. However, modern virtualized architectures also increase the complexity of testing, introducing new risks.

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