Critical SD-WAN Test Patterns and Measurements

 Critical SD-WAN Test Patterns and MeasurementsIn today’s virtualized software-defined wide area network (SD-WAN) environments, an organization will move some or all of the traditional private WAN infrastructure over secure virtual ‘Circuits’ riding over public and semi-public clouds. This technology has great potential for WAN link spin up time and dramatic cost savings over traditional classic WAN links such as MPLS or dedicated point-to-point lines.

The technology is not without its deployment and operational challenges, however. It is especially critical how we test SD-WAN infrastructure and that we define a meaningful approach to its measurement.

This paper discusses the unique testing challenges and best practices associated with SD-WAN testing success.


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