Spirent offers the most accurate, efficient and complete solutions for testing modern receivers.
Modern wireless technologies such as LTE (including LTE-Advanced and TD-LTE) rely on Multiple-Input Multiple-Output (MIMO) and beamforming technology to deliver higher data rates, greater coverage, and lower operational costs. However, RF testing of base station and mobile device receivers is both complex and critical.
What to Test
Progress in understanding these advanced antenna techniques has led to important advancements in optimizing next-generation networks. Key areas of verification include:
- MIMO beamforming systems (up to and including 8x2 MU-MIMO)—currently being tested for deployment in TD-LTE networks. Because TD-LTE system performance is extremely sensitive to phase characteristics, testing requires a much higher degree of phase accuracy than is required in other types of testing
- Over-the-air (OTA) MIMO testing—Testing involves complex configurations that must be easily and efficiently set up and executed
- Virtual Drive Testing—not only saves on the high costs involved in iterated drive testing, but it provides a testing scenario that includes a reliably repeatable RF environment
Spirent Solutions
A leader in the art of RF channel emulation, Spirent offers the most accurate, efficient and complete solutions for testing modern receivers including realistic MIMO emulation, OTA testing and virtual drive testing:
Do you Know MIMO-OTA (webinar)
Madhu Gurumurthy, Spirent
Video hosted by Spirent Communications – recorded May 26, 2011
What You Don’t Know About MIMO (but should)—(webinar)
Madhu Gurumurthy and Mike McKernan, Spirent
Video hosted by Spirent Communications – recorded March 31, 2011
Spatial Channel Emulator from Spirent (interview)
Lou Frenzel and Nigel Wright of Spirent
Video hosted by engineering tv – recorded March 23, 2011
MIMO-OTA Expert Forum (panel discussion)
Including Spirent’s Doug Reed
Video hosted by Microwave Journal magazine – recorded March 24, 2011 at CTIA Wireless (Orlando)
Dynamic Correlation in Virtual Drive Testing
Madhu Gurumurthy, Spirent
Microwave Journal, August 2010
MIMO-OTA Device Testing With Anechoic Chambers
Madhu Gurumurthy and Mike McKernan, Spirent
Microwave Journal, March 14, 2011
MIMO – LTE Game Changer or a Show Stopper?
Nigel Wright, Spirent
EE Times Design Line, April 11, 2011
VR5 Product Review
Jack Browne
Microwaves & RF, April 2011
One-box channel emulator reduces complexity of MIMO testing
Jean-Pierre Joosting
EE Times Europe, March 16, 2011
MIMO Over-the-Air Testing
Doug Reed, Spirent
Microwave Journal Technical Library, March, 2010